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One platform. Four perspectives.

Deeper Scan

See inside. Build intelligence.
Create data. Verify devices.

From CT and X-ray viewing to model development, data generation and automated device inspection. Choose the tools for your workflow.

CT & X-ray ViewerScan inspection

CT and X-ray workspace

01 / Explore what is inside

See inside. A clearer view.

Inspect CT volumes and X-ray images directly in your browser. Fast rendering and detailed views help your team see what is inside and review areas that need attention.

  • Web-based CT and X-ray viewing
  • Fast scan rendering
  • Detailed internal inspection
Discuss CT & X-ray Viewer
01

Open

Open CT volumes or X-ray images in a browser-based workspace.

02

Explore

Explore layers in CT volumes or examine details in X-ray images.

03

Review

Examine the details that matter to your inspection.

CT & X-ray TrainingModel development

annotation workflow

02 / Build your intelligence

Your data. Your models.

Turn your CT and X-ray data into a model-building workflow. Label objects, train your own models and test their performance against the scenarios that matter to your operation.

  • CT and X-ray data labelling
  • Custom model training
  • Model testing and evaluation
Discuss CT & X-ray Training
01

Label

Annotate CT volumes and X-ray images with the objects and categories you need.

02

Train

Use the labelled data to train models for your application.

03

Test

Evaluate model results on separate test data before deployment.

CT & X-ray TIPDataset generation

object insertion workflow

03 / Multiply the possibilities

More scenarios. Less manual work.

Insert synthetic and real scanned objects into CT and X-ray bag scans. Automatically create varied datasets for training and testing, expanding the scenarios your models can learn from.

  • Synthetic and real object insertion
  • Automated CT and X-ray bag-data generation
  • Large-scale training and test datasets
Discuss CT & X-ray TIP
01

Select

Choose CT or X-ray bag scans and compatible synthetic or real scanned objects.

02

Compose

Insert objects into the scans to create varied bag contents.

03

Generate

Automatically produce datasets at scale for training and testing.

NDTDevice verification

Device inspection

Customer interface

Deeper Scan

Original Deeper Scan analysis interface showing an electronic device X-ray, a highlighted area, Threat Detected status, and Clear and Review controls.

Original Deeper Scan analysis interface.

04 / Verify what is inside

A closer look at every device.

A dedicated inspection cabinet for electronic-device verification. Compare internal components with trusted references to identify tampered or counterfeit electronics and highlight unexpected differences for review.

  • Electronic-device verification
  • Tampering and counterfeit checks
  • Automated component comparison
Discuss NDT
Device integrity Authenticity checks Anomaly detection

Analysis interface

Review the scan.
See what needs attention.

Inspect the device’s X-ray, locate a highlighted area and use the Clear or Review controls to decide the next step.

NDT analysis interface showing a device X-ray, a highlighted internal area, Threat Detected status, and Clear and Review controls
NDT analysis interfaceOpen full-size image

Look beyond the casing

Make the differences visible.

Identify additional, modified or missing components against the device’s expected configuration.

Choose a comparison
X-ray comparison
Reference device01 / REFERENCE
Expected configuration
Inspected device02 / CAPTURE
Tampering difference highlightedCaptured configuration

Tampered

The device has an unexpected internal modification.

An extra integrated circuit is present compared with the trusted reference, highlighting a possible tampered configuration for review.

  • +Unexpected integrated circuit
Reference device01 / REFERENCE
Expected configuration
Inspected device02 / CAPTURE
12345
Component differences highlightedCaptured configuration

Counterfeit configuration

The device does not match its expected configuration.

The inspected device has additional chips, modified components and a missing memory component compared with its trusted reference.

  • 01Modified main processor
  • 02Missing memory component
  • 03Additional controller chip
  • 04Additional support chip
  • 05Modified power module

The inspection workflow

From device to decision.

01 — 06
  1. 01

    Load the device

    Place the item inside and close the cabinet.

  2. 02

    Capture the scan

    Scan and transfer to cloud or local analysis.

  3. 03

    Find a reference

    Identify the device or a suitable similar match.

  4. 04

    Compare components

    Identify additional, modified or missing components against trusted reference data.

  5. 05

    Assess differences

    Highlight differences that need a closer look.

  6. 06

    Route for review

    Alert an operator or send to a review centre.

Analysis where you need it

Cloud or local. Your environment.

Cloud analysis

Send scans to cloud-hosted analysis and reference data.

Cabinet Cloud Review

Local analysis

Run analysis with a self-hosted reference database.

Cabinet Local server Review

Additional inspection capability

Investigate concealed material.

Alongside electronic-device integrity checks, NDT can highlight unexpected internal material for investigation, including possible concealment of explosives or narcotics.

Choose the inspection arrangement for the substances, devices and workflow you need to assess.

Built around your workflow

Start with the part
that matters to you.

Viewing, model development, data generation or device verification. Let’s discuss how Deeper Scan fits your operation.

Talk to our team